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投稿时间:2018-09-17
投稿时间:2018-09-17
中文摘要: 通过微波消解法,采用HNO3-H2O2/HNO3-HCl-HF 两种不同的体系分步消解样品的前处理方法,然后应用电感耦合等离子体发射光谱法,进行样品含量的测定,建立食品及食品添加剂中不可溶性硅含量的测定方法。该方法以硅计的最低检出限为0.24 mg/kg,加标回收率为91.0%~106.2%,该方法检出限低、分析准确、能够有效消除复杂的基体干扰,同时还能够扣除本底的影响,是一种理想的测定食品及食品添加剂中不可溶性硅含量的测定方法。
中文关键词: 电感耦合等离子体发射光谱法 不可溶性硅 基体干扰 扣除本底 测定方法
Abstract:Samples of food and food additives were pretreated with microware digestion method.Nitric acid-Hydrogen peroxide/ Nitric acid-Hydrochloric acid-Hydrofluoric acid system was used respectively in the microware digestion method.Then samples were detected by the inductively coupled plasma emission spectrometry.Above-mentioned method was a new detection method established for insoluble silicon in food and food additives.In this method,the lowest detection limit of insoluble silicon in silicon was 0.24 mg/kg,the recovery of standard addition was 91.0 %-106.2 %.Because of the low detection limit,accurate analysis,effectively eliminating the interference of complex matrix and deducting the effect of the background,this method can be used as detection method for insoluble silicon in food and food additives.
keywords: inductively coupled plasma emission spectrometry insoluble silicon matrix interference deduction of background determination method
文章编号:201910029 中图分类号: 文献标志码:
基金项目:
Author Name | Affiliation |
GAO Xi-feng,LIU Yan-ming,CHEN Xiao-yuan,ZHANG Xi-qi,DONG Rui,CHENG Yue-hong,CUI Yu-hua | Shandong Institute for Food and Drug Control,Jinan 250101,Shandong,China |
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